The program

2 days of conferences in free access

23 conferences animated by experts: ARMIR, CAP'TRONIC, CFM, ELYZEE CONSORTIUM, LCIE BUREAU VERITAS, MIM, Opticsvalley, Revue ELECTRONIQUES and suggested by exhibitors among ALLIED VISION TECHNOLOGIES, EUROTHERM AUTOMATION, FARO, HBM and NATIONAL INSTRUMENTS

The access to the conferences is FREE under presentation of your badge.
To register:  MY BADGE

TUESDAY OCTOBER 23RD

In the limit of the places available. We advise you to go to the room 15 minutes before the beginning of the conference.

  ROOM 1
09:00 LTE-M, NB-IOT, 5G: differences, implementation and main use cases (CAP'TRONIC)
14:00 New technologies of industrial vision and its role in the industry of the future (Round table of ElectroniqueS)
15:00

 Du capteur au Cloud : une nouvelle ère pour l’industrie de demain, un véritable potentiel (HBM)

  ROOM 2
10:00 Overview of the fight against counterfeiting (ARMIR)
10:45 THID: a new THz technique for the identification of products (ARMIR)
11:30  Infrared stimulated thermography: anti-counterfeiting tool (ARMIR)
14:15 IR / THz multispectral imaging 2D and 3D dedicated to control and inspection (ARMIR)
15:00 Pharmaceutical counterfeit analysis by THz technology (ARMIR)
 
  ROOM 3
09:00 Deep Tech for Smart Manufacturing (OPTICS VALLEY)
14:00 Optimization of calibration intervals / Quiz Calibration and verification: what a difference (CFM)
15:00  Metrology serving the industry of the future (FARO)


WEDNESDAY OCTOBER 24TH

 

  ROOM 1
09:00 IA in the embedded: the main principles and constraints (CAP'TRONIC)
14:00 AI in the service of the human, is this the case? (MIM)
14:00

IA societal side 2 (MIM)

  ROOM 2
09:30 Automobile mutation to autonomous vehicles has already begun, participate to the transition (NATIONAL INSTRUMENTS)
10:30 To the detection of counterfeits by ultrafast pulse THz control (AMIR)
11:15  Machine learning: a new path in the fight against counterfeiting (AMIR)
12:00 Evolution of microelectronic technologies and systems towards connected objects and IoT (GIP CNFM)
14:00 Knowledge to use before using industrial vision cameras for embedded applications (ALLIED VISION TECHNOLOGIES)
15:00

Metrology of the Future: How to dematerialize the management of your calibrations? (EUROTHERM AUTOMATION)

  ROOM 3
09:30 Why estimate its measurement uncertainties? Quiz Uncertainty measurement: what do I need to know? (CFM)
10:30  How to support optoelectronics  companies thanks to mechatronics (ELYZEE CONSORTIUM)
11:30 IoT and connected objects: How cybersecurity issues will impact future regulatory compliance (LCIE BUREAU VERITAS)
14:00 Reverse engineering for the automotive industry / Quiz How to choose 3D measurement (CFM)



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